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 NUF2900MN Two Line EMI Filter with ESD Protection for High Speed Data Interface
NUF2900MN is a two line EMI filter with ESD protection designed for high speed data interface. It offers greater than -30 dB attenuation at frequencies from 800 MHz to 6.0 GHz while supporting data rates as high as 250 Mbps (125 MHz).
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Features
* Provides EMI Filtering and ESD Protection * Maximum Data Rate up to 250 Mbps * Maximum ESD Rating of: * * * * * * * *
5.0 kV (Contact) DFN8, 2x2 mm Package Moisture Sensitivity Level 1 ESD Ratings: Machine Model = C Human Body Model = 3B This is a Pb-Free Device*
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5
(Top View)
Applications
MARKING DIAGRAM
DFN8 CASE 506AA PLASTIC 1 4 U9 M G G
EMI Filtering and ESD Protection for High Speed Data Interface Serializer / Deserializer Camera Imager Interface High Resolution Color LCD Display
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U9 = Specific Device Code M = Date Code G = Pb-Free Package (Note: Microdot may be in either location)
OUT1 NC NC OUT2
8 7 GND 6 5
1 2 3 4
IN1 NC NC IN2
(Bottom View)
ORDERING INFORMATION
Device NUF2900MNT1G Package DFN8 (Pb-Free) Shipping 3000/Tape & Reel
*For additional information on our Pb-Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D.
(c) Semiconductor Components Industries, LLC, 2007
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April, 2007 - Rev. 0
Publication Order Number: NUF2900MN/D
NUF2900MN
MAXIMUM RATINGS
Parameter ESD Discharge IEC61000-4-2 Operating Temperature Range Storage Temperature Range Maximum Lead Temperature for Soldering Purposes (1.8 in from case for 10 s) Contact Discharge Symbol VPP TOP Tstg TL Value 5.0 -40 to 85 -55 to 150 260 Unit kV C C C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
ELECTRICAL CHARACTERISTICS (TJ = 25C unless otherwise noted)
Parameter Maximum Reverse Working Voltage Breakdown Voltage Leakage Current Resistance Effective Capacitance (Note 1) Inductance Capacitance (Note 2) Cut-Off Frequency (Note 3) Above this frequency, appreciable attenuation occurs IR = 1.0 mA VRWM = 3.3 V Test Conditions Symbol VRWM VBR IR RA Ceff L Cline f3dB 3.6 10.4 22.1 33 350 6.0 7.0 Min Typ Max 5.0 8.3 0.1 5.0 Unit V V mA W pF nH pF MHz
1. Refer to "Effective Capacitance Calculation" below. 2. Measured at 25C, VR = 0 V, f = 1.0 MHz. 3. 50 W source and 50 W load termination.
Effective Capacitance Calculation
The capacitance of the NUF2900MN can be determined a number of ways. When evaluated using low frequency, low current capacitance measurement equipment CLINE (line capacitance), it is determined to be approximately 33 pF. When used in systems that have signal rise and fall times of 1 ns or less CEFFECTIVE (effective capacitance), it is closer to 10.4 pF. If the rise and fall times of a signal is determined by the capacitance of the NUF2900MN, then an "effective" capacitance can be calculated using the following function based on a simple "RC" combination.
*t V OUT + V IN 1 * e R TerminationC Effective
CEffective +
R
*t VOUT ln 1 * V
IN
* 1.08ns CEffective + 50 ln(1 * 0.88)
NUF2900MN
RSource + CEffective VSource RTermination VIN VOUT
The rise time "t" is approximately 1.08 ns with VOUT 88% of VIN where the network impedance is 50 W. When solving for CEFFECTIVE, the capacitance is found to be 10.4 pF.
If the data signal source has a rise and fall time slower than 1 ns, the NUF2900MN will have a filtered output with a similar rise and fall time. CEFFECTIVE will scale accordingly as rise/fall times increase until it reaches CLINE.
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NUF2900MN
TYPICAL PERFORMANCE CURVES
(TA = 25C unless otherwise specified) 0 -5 -10 -15 -20 -25 -30 -35 -40 -45 -50 -55 -60 10 100 1000 10,000 FREQUENCY (MHz) 0 -10 -20 S41 (dB) -30 -40 -50 -60 -70 -80 100 1000 FREQUENCY (MHz) 10000
S21 (dB)
Figure 1. Typical Insertion Loss Characteristic (S21 Measurement)
1.50 1.00 0.50 0
Figure 2. Analog Crosstalk Curve (S41 Measurement - 50 W Load)
GD12 (nsec)
-0.50 -1.00 -1.50 1.0E+05
1.0E+06
1.0E+07
1.0E+08
1.0E+09 1.0E+10
FREQUENCY (Hz)
Figure 3. Actual High Speed (100 MHz) Pulse Wave Form of NUF2900MN
Figure 4. Group Delay Characteristics Simulation for NUF2900MN
Figure 5. ESD Scope Trace - IEC Waveform Actual Response of NUF2900MN http://onsemi.com
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NUF2900MN
PACKAGE DIMENSIONS
DFN8 CASE 506AA-01 ISSUE D
D A B
NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994 . 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.25 AND 0.30 MM FROM TERMINAL. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.20 REF 0.20 0.30 2.00 BSC 1.10 1.30 2.00 BSC 0.70 0.90 0.50 BSC 0.20 --- 0.25 0.35
PIN ONE REFERENCE
2X
0.10 C
2X
0.10 C
0.10 C
8X
0.08 C
SEATING PLANE
A1
8X
L
K
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. "Typical" parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303-675-2175 or 800-344-3860 Toll Free USA/Canada Fax: 303-675-2176 or 800-344-3867 Toll Free USA/Canada Email: orderlit@onsemi.com N. American Technical Support: 800-282-9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81-3-5773-3850 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative
CCCC CCCC CCCC CCCC
D2 e/2
1 8
E
TOP VIEW
DIM A A1 A3 b D D2 E E2 e K L
A
SIDE VIEW
(A3) C
e
4
E2
5 8X
b
0.10 C A B 0.05 C
NOTE 3
BOTTOM VIEW
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NUF2900MN/D


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